36 #ifndef SDL_test_h_arness_h 37 #define SDL_test_h_arness_h 47 #define TEST_ENABLED 1 48 #define TEST_DISABLED 0 51 #define TEST_ABORTED -1 52 #define TEST_STARTED 0 53 #define TEST_COMPLETED 1 54 #define TEST_SKIPPED 2 57 #define TEST_RESULT_PASSED 0 58 #define TEST_RESULT_FAILED 1 59 #define TEST_RESULT_NO_ASSERT 2 60 #define TEST_RESULT_SKIPPED 3 61 #define TEST_RESULT_SETUP_FAILURE 4
SDLTest_TestCaseTearDownFp testTearDown
void(* SDLTest_TestCaseTearDownFp)(void *arg)
SDLTest_TestCaseSetUpFp testSetUp
const SDLTest_TestCaseReference ** testCases
struct SDLTest_TestCaseReference SDLTest_TestCaseReference
int(* SDLTest_TestCaseFp)(void *arg)
void(* SDLTest_TestCaseSetUpFp)(void *arg)
struct SDLTest_TestSuiteReference SDLTest_TestSuiteReference
char * SDLTest_GenerateRunSeed(const int length)
Generates a random run seed string for the harness. The generated seed will contain alphanumeric char...
int SDLTest_RunSuites(SDLTest_TestSuiteReference *testSuites[], const char *userRunSeed, Uint64 userExecKey, const char *filter, int testIterations)
Execute a test suite using the given run seed and execution key.
GLuint GLsizei GLsizei * length
SDLTest_TestCaseFp testCase
GLint GLint GLint GLint GLint GLint GLint GLbitfield GLenum filter